8300 - ECONOMETRIC METHODS FOR INNOVATION STUDIES
MM-LS - AFC-LS - CLAPI-LS - CLEFIN-LS - CLELI-LS - DES-LS - CLG-LS - M-LS - IM-LS - ACME-LS - EMIT-LS
Department of Management and Technology
Course taught in English
Go to class group/s: 31
MM-LS (6 credits - II sem. - AI) - AFC-LS (6 credits - II sem. - AI) - CLAPI-LS (6 credits - II sem. - AI) - CLEFIN-LS (6 credits - II sem. - AI) - CLELI-LS (6 credits - II sem. - AI) - DES-LS (6 credits - II sem. - AI) - CLG-LS (6 credits - II sem. - AI) - M-LS (6 credits - II sem. - AI) - IM-LS (6 credits - II sem. - AI) - ACME-LS (6 credits - II sem. - AI) - EMIT-LS (6 credits - II sem. - AI)
Course Director:
ROBERTO FONTANA
ROBERTO FONTANA
Course Objectives
The course introduces the student to the empirical methods employed in the analysis of innovation. The course presents techniques designed to deal both with the specificities of the data employed in innovation studies (e.g. survey data, innovation counts, patents, etc.) and with some innovation related phenomena (e.g. technology diffusion, firms entry and exit, propensity to innovate, evaluation of new products, etc.). The aim of the course will be met through both theoretical lectures and applied computer sessions. All techniques will be presented with reference to some specific application in the innovation literature. It is recommended that students have knowledge of the topics covered in a basic econometrics course.
Course Content Summary
-
Review of linear estimation methods: ordinary and generalized least squares
-
Maximum Likelihood Estimation
-
Analysis of innovation using qualitative and survey data: models for categorical dependent variables (binary, ordinal and categorical outcomes)
-
Modeling patent distribution using quantile regression
-
Corner solution responses and censored distributions: Tobit and truncated regressions
-
Patents and innovation counts: Poisson and negative binomial regressions
-
Evaluation of product innovation: hedonic regressions and hedonic price indexes
-
Analysis of industrial dynamics and technological diffusion: duration models
Detailed Description of Assessment Methods
Written exam.Textbooks
-
J.M. WOOLDRIDGE, Introductory Econometrics: A Modern Approach, Thomson, 3rd ed.
-
Further readings are given during the lectures.
Last change 30/04/2009 08:46